The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (muliti-sites test) functions (512 I/O Pins to test 512 OCs in parallel) that can meet the upcoming higher testing demands.
The test system 3380P also has built in all-in -one design (for test head only) to provide a small footprint /clear power ATE to become a very competitive price / performance ratio test system.